TEST_NAME : Wafer
TEST_DATE : 24_08_20-15_47_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-013-013-04 | FUSED_ID : 6359364768382374100
  IC_TEMP :  -74.24 | VDDM : 1110.25 | AUX_INT :  -10.72 | CsaBias :   58.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.75740e-03 / 2
  ADC_P0  : -1.07226e-02 ± 2.84115e-02
  ADC_P1  : 8.71622e-03 ± 7.12868e-04
  ADC_P2  : -6.47022e-06 ± 3.57140e-06
  CSA_Chi2/NDF : 1.68343e-04 / 2
  CSA_P0  : 5.64376e-02 ± 8.65405e-03
  CSA_P1  : 1.02504e-02 ± 6.52020e-04
  CSA_P2  : -6.44377e-05 ± 9.92950e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [8, 11, 13, 18, 34, 51, 65, 75, 82, 90, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  20
 | P_BROKEN_FAST :  [11, 21, 23, 32, 34, 37, 39, 54, 56, 58, 65, 68, 75, 78, 85, 98, 100, 106, 108, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4305', '1.800', '0.1451', '1.800', '0.1004', '7.001', '0.7076', 1, 1, 1, 1, 1724161621.5258899]
VI_after__Init : ['1.201', '0.4333', '1.800', '0.1454', '1.800', '0.0944', '7.000', '0.7076', 1, 1, 1, 1, 1724161629.5113218]
VI_at__the_End : ['1.201', '0.4398', '1.800', '0.1320', '1.804', '0.1186', '7.000', '0.7085', 1, 1, 1, 1, 1724161685.8360252]