TEST_NAME : Wafer
TEST_DATE : 24_08_20-15_39_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-013-017-03 | FUSED_ID : 6359364768382374163
  IC_TEMP :  -73.02 | VDDM : 1103.88 | AUX_INT :  -10.84 | CsaBias :   67.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.94762e-03 / 2
  ADC_P0  : -1.08352e-02 ± 2.99555e-02
  ADC_P1  : 8.74195e-03 ± 7.58522e-04
  ADC_P2  : -6.28054e-06 ± 3.83714e-06
  CSA_Chi2/NDF : 1.30937e-04 / 2
  CSA_P0  : 5.83056e-02 ± 7.63227e-03
  CSA_P1  : 1.03039e-02 ± 5.75037e-04
  CSA_P2  : -6.37558e-05 ± 8.75713e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [9, 27, 30, 63, 79, 83, 94, 95, 98, 103, 107, 108, 112, 117, 118, 119, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [0, 5, 6, 32, 57, 64, 82, 83, 86, 95, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2317', '1.800', '0.1561', '1.799', '0.0921', '7.000', '0.7076', 1, 1, 1, 1, 1724161194.4316833]
VI_after__Init : ['1.202', '0.2317', '1.800', '0.1561', '1.800', '0.0863', '7.000', '0.7076', 1, 1, 1, 1, 1724161201.950094]
VI_at__the_End : ['1.201', '0.4462', '1.800', '0.1371', '1.803', '0.1165', '7.000', '0.7085', 1, 1, 1, 1, 1724161262.1634166]