TEST_NAME : Wafer
TEST_DATE : 24_08_20-15_36_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-013-019-03 | FUSED_ID : 6359364768382374195
  IC_TEMP :  -63.02 | VDDM : 1112.11 | AUX_INT :   -8.20 | CsaBias :   58.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10811e-03 / 2
  ADC_P0  : -8.20454e-03 ± 2.25214e-02
  ADC_P1  : 8.37832e-03 ± 5.49104e-04
  ADC_P2  : -6.06357e-06 ± 2.65298e-06
  CSA_Chi2/NDF : 1.20475e-04 / 2
  CSA_P0  : 5.89307e-02 ± 7.32101e-03
  CSA_P1  : 9.48286e-03 ± 5.51585e-04
  CSA_P2  : -4.94543e-05 ± 8.39999e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [9, 10, 15, 22, 37, 45, 54, 57, 60, 65, 68, 73, 77, 87, 119, 121, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [3, 26, 38, 45, 57, 58, 71, 85, 91, 102, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4081', '1.800', '0.1634', '1.799', '0.1028', '7.000', '0.7072', 1, 1, 1, 1, 1724160980.5834014]
VI_after__Init : ['1.201', '0.4093', '1.800', '0.1645', '1.800', '0.0968', '7.000', '0.7076', 1, 1, 1, 1, 1724160988.9356122]
VI_at__the_End : ['1.201', '0.4552', '1.800', '0.1329', '1.803', '0.1173', '7.000', '0.7081', 1, 1, 1, 1, 1724161049.5179377]