TEST_NAME : Wafer
TEST_DATE : 24_08_20-15_32_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-013-021-03 | FUSED_ID : 6359364768382374227
  IC_TEMP :  -74.61 | VDDM : 1119.57 | AUX_INT :   -9.46 | CsaBias :   60.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43801e-03 / 2
  ADC_P0  : -9.46295e-03 ± 2.56814e-02
  ADC_P1  : 8.80029e-03 ± 6.53714e-04
  ADC_P2  : -6.66502e-06 ± 3.30909e-06
  CSA_Chi2/NDF : 1.76028e-04 / 2
  CSA_P0  : 5.99314e-02 ± 8.84938e-03
  CSA_P1  : 1.03097e-02 ± 6.66737e-04
  CSA_P2  : -6.40947e-05 ± 1.01536e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [5, 10, 32, 37, 43, 65, 67, 69, 94, 95, 99, 107, 109, 110, 123, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [1, 2, 16, 29, 33, 39, 49, 54, 87, 107, 108, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1898', '1.800', '0.1370', '1.799', '0.0926', '7.000', '0.7074', 1, 1, 1, 1, 1724160767.0299382]
VI_after__Init : ['1.200', '0.1897', '1.800', '0.1369', '1.801', '0.0880', '7.000', '0.7078', 1, 1, 1, 1, 1724160774.7563064]
VI_at__the_End : ['1.201', '0.4511', '1.800', '0.1355', '1.769', '0.1199', '7.000', '0.7079', 1, 1, 1, 1, 1724160835.032689]