TEST_NAME : Wafer
TEST_DATE : 24_08_20-15_31_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-013-022-03 | FUSED_ID : 6359364768382374243
  IC_TEMP :  -71.11 | VDDM : 1118.12 | AUX_INT :  -10.08 | CsaBias :   51.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53788e-03 / 2
  ADC_P0  : -1.00751e-02 ± 2.65374e-02
  ADC_P1  : 8.85232e-03 ± 6.71708e-04
  ADC_P2  : -7.06683e-06 ± 3.38352e-06
  CSA_Chi2/NDF : 1.50177e-04 / 2
  CSA_P0  : 5.94713e-02 ± 8.17381e-03
  CSA_P1  : 1.07489e-02 ± 6.15838e-04
  CSA_P2  : -6.79101e-05 ± 9.37848e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [25, 42, 48, 60, 64, 65, 69, 74, 76, 91, 109, 114, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [3, 4, 15, 21, 59, 86, 92, 98, 107, 108, 111, 119, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3837', '1.800', '0.1572', '1.799', '0.1012', '7.000', '0.7075', 1, 1, 1, 1, 1724160660.492242]
VI_after__Init : ['1.202', '0.3852', '1.800', '0.1575', '1.800', '0.0952', '7.000', '0.7076', 1, 1, 1, 1, 1724160669.175615]
VI_at__the_End : ['1.201', '0.4581', '1.800', '0.1356', '1.801', '0.1199', '7.000', '0.7082', 1, 1, 1, 1, 1724160728.800923]