TEST_NAME : Wafer
TEST_DATE : 24_08_20-15_23_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-013-026-03 | FUSED_ID : 6359364768382374307
  IC_TEMP :  -65.34 | VDDM : 1124.17 | AUX_INT :   -7.69 | CsaBias :   60.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16903e-03 / 2
  ADC_P0  : -7.68849e-03 ± 2.31253e-02
  ADC_P1  : 8.54859e-03 ± 5.71917e-04
  ADC_P2  : -6.68591e-06 ± 2.78816e-06
  CSA_Chi2/NDF : 1.42800e-04 / 2
  CSA_P0  : 5.74296e-02 ± 7.97052e-03
  CSA_P1  : 9.47302e-03 ± 6.00521e-04
  CSA_P2  : -4.64925e-05 ± 9.14522e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [10, 27, 28, 38, 48, 49, 50, 55, 57, 60, 74, 85, 88, 93, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [2, 7, 30, 32, 35, 46, 59, 72, 78, 79, 83, 101, 116, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1971', '1.800', '0.1556', '1.799', '0.0901', '7.000', '0.7090', 1, 1, 1, 1, 1724160234.507857]
VI_after__Init : ['1.201', '0.1972', '1.800', '0.1557', '1.801', '0.0828', '7.000', '0.7081', 1, 1, 1, 1, 1724160242.503243]
VI_at__the_End : ['1.201', '0.4655', '1.800', '0.1302', '1.805', '0.1184', '7.000', '0.7088', 1, 1, 1, 1, 1724160297.9059074]