TEST_NAME : Wafer
TEST_DATE : 24_08_20-16_15_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-014-008-10 | FUSED_ID : 6359364768382378122
  IC_TEMP :  -95.43 | VDDM : 1114.10 | AUX_INT :  -12.28 | CsaBias :   42.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.27987e-03 / 2
  ADC_P0  : -1.22798e-02 ± 3.24062e-02
  ADC_P1  : 9.16313e-03 ± 8.52908e-04
  ADC_P2  : -6.87160e-06 ± 4.51186e-06
  CSA_Chi2/NDF : 9.40557e-05 / 2
  CSA_P0  : 5.86435e-02 ± 6.46867e-03
  CSA_P1  : 1.05176e-02 ± 4.87367e-04
  CSA_P2  : -7.78794e-05 ± 7.42203e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [14, 37, 45, 46, 51, 52, 58, 78, 81, 85, 91, 103, 109, 116, 120, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [0, 13, 16, 23, 41, 65, 67, 78, 84, 106, 109, 111, 116, 118, 121, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3445', '1.800', '0.1640', '1.799', '0.0985', '7.000', '0.7079', 1, 1, 1, 1, 1724163325.2292626]
VI_after__Init : ['1.201', '0.3470', '1.800', '0.1654', '1.799', '0.0926', '7.000', '0.7079', 1, 1, 1, 1, 1724163333.1926787]
VI_at__the_End : ['1.201', '0.4093', '1.800', '0.1362', '1.802', '0.1205', '7.000', '0.7087', 1, 1, 1, 1, 1724163388.4934845]