TEST_NAME : Wafer
TEST_DATE : 24_08_20-16_18_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-014-010-10 | FUSED_ID : 6359364768382378154
  IC_TEMP :  -82.39 | VDDM : 1110.07 | AUX_INT :  -11.81 | CsaBias :   57.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.11549e-03 / 2
  ADC_P0  : -1.18072e-02 ± 3.12159e-02
  ADC_P1  : 8.76918e-03 ± 7.91219e-04
  ADC_P2  : -6.11738e-06 ± 4.02942e-06
  CSA_Chi2/NDF : 1.07893e-04 / 2
  CSA_P0  : 6.02404e-02 ± 6.92816e-03
  CSA_P1  : 1.06180e-02 ± 5.21987e-04
  CSA_P2  : -7.35150e-05 ± 7.94925e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [1, 12, 19, 24, 27, 33, 60, 65, 66, 79, 95, 104, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [5, 7, 11, 17, 24, 56, 57, 59, 64, 68, 73, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3646', '1.800', '0.1141', '1.799', '0.0970', '7.000', '0.7079', 1, 1, 1, 1, 1724163539.063967]
VI_after__Init : ['1.201', '0.3670', '1.800', '0.1144', '1.800', '0.0914', '7.000', '0.7081', 1, 1, 1, 1, 1724163547.1113243]
VI_at__the_End : ['1.201', '0.4339', '1.800', '0.1352', '1.801', '0.1197', '7.000', '0.7086', 1, 1, 1, 1, 1724163603.112072]