TEST_NAME : Wafer
TEST_DATE : 24_08_20-16_20_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-014-011-10 | FUSED_ID : 6359364768382378170
  IC_TEMP :  -87.34 | VDDM : 1122.92 | AUX_INT :   -9.50 | CsaBias :   26.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43878e-03 / 2
  ADC_P0  : -9.49606e-03 ± 2.57061e-02
  ADC_P1  : 8.95176e-03 ± 6.70931e-04
  ADC_P2  : -6.52814e-06 ± 3.48980e-06
  CSA_Chi2/NDF : 1.48302e-04 / 2
  CSA_P0  : 5.99733e-02 ± 8.12262e-03
  CSA_P1  : 1.02519e-02 ± 6.11981e-04
  CSA_P2  : -7.02926e-05 ± 9.31974e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [12, 36, 45, 66, 79, 88, 108, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [12, 18, 21, 24, 38, 57, 58, 59, 63, 65, 80, 81, 96, 103, 114, 118, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3323', '1.800', '0.1302', '1.799', '0.1014', '7.000', '0.7079', 1, 1, 1, 1, 1724163645.6538105]
VI_after__Init : ['1.202', '0.3344', '1.800', '0.1305', '1.800', '0.0955', '7.000', '0.7082', 1, 1, 1, 1, 1724163653.672231]
VI_at__the_End : ['1.201', '0.4235', '1.800', '0.1359', '1.776', '0.1200', '7.000', '0.7086', 1, 1, 1, 1, 1724163710.4739356]