TEST_NAME : Wafer
TEST_DATE : 24_08_20-16_26_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-014-014-10 | FUSED_ID : 6359364768382378218
  IC_TEMP :  -73.08 | VDDM : 1107.57 | AUX_INT :   -9.84 | CsaBias :   59.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63486e-03 / 2
  ADC_P0  : -9.83610e-03 ± 2.74154e-02
  ADC_P1  : 8.67231e-03 ± 6.89458e-04
  ADC_P2  : -6.33706e-06 ± 3.45109e-06
  CSA_Chi2/NDF : 1.82375e-04 / 2
  CSA_P0  : 6.06931e-02 ± 9.00752e-03
  CSA_P1  : 1.05556e-02 ± 6.78651e-04
  CSA_P2  : -6.55903e-05 ± 1.03351e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [0, 7, 18, 20, 25, 34, 35, 59, 73, 76, 81, 82, 94, 95, 106, 122, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [2, 26, 44, 48, 59, 81, 94, 109, 117, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3989', '1.800', '0.1623', '1.799', '0.0978', '7.000', '0.7079', 1, 1, 1, 1, 1724163966.045445]
VI_after__Init : ['1.201', '0.4002', '1.800', '0.1625', '1.800', '0.0922', '7.000', '0.7080', 1, 1, 1, 1, 1724163974.0358362]
VI_at__the_End : ['1.201', '0.4620', '1.800', '0.1386', '1.799', '0.1154', '7.000', '0.7085', 1, 1, 1, 1, 1724164030.8235164]