TEST_NAME : Wafer
TEST_DATE : 24_08_20-16_27_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-014-015-10 | FUSED_ID : 6359364768382378234
  IC_TEMP :  -77.28 | VDDM : 1120.66 | AUX_INT :   -9.72 | CsaBias :   51.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.65167e-03 / 2
  ADC_P0  : -9.71713e-03 ± 2.75664e-02
  ADC_P1  : 8.83380e-03 ± 7.08216e-04
  ADC_P2  : -6.49715e-06 ± 3.62013e-06
  CSA_Chi2/NDF : 1.50914e-04 / 2
  CSA_P0  : 6.16339e-02 ± 8.19382e-03
  CSA_P1  : 1.03379e-02 ± 6.17345e-04
  CSA_P2  : -6.54840e-05 ± 9.40144e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [10, 16, 19, 40, 62, 94, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [2, 8, 14, 21, 23, 59, 70, 86, 99, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1737', '1.800', '0.1344', '1.799', '0.0820', '7.000', '0.7079', 1, 1, 1, 1, 1724164073.3022707]
VI_after__Init : ['1.201', '0.1738', '1.800', '0.1345', '1.800', '0.0766', '7.000', '0.7079', 1, 1, 1, 1, 1724164081.2606807]
VI_at__the_End : ['1.201', '0.4481', '1.800', '0.1370', '1.803', '0.1182', '7.000', '0.7085', 1, 1, 1, 1, 1724164139.319227]