TEST_NAME : Wafer
TEST_DATE : 24_08_20-16_47_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-014-026-13 | FUSED_ID : 6359364768382378413
  IC_TEMP :  -59.34 | VDDM : 1121.50 | AUX_INT :   -6.01 | CsaBias :   77.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01626e-03 / 2
  ADC_P0  : -6.00693e-03 ± 2.16083e-02
  ADC_P1  : 8.41183e-03 ± 5.43796e-04
  ADC_P2  : -5.36157e-06 ± 2.70645e-06
  CSA_Chi2/NDF : 1.35350e-04 / 2
  CSA_P0  : 5.71911e-02 ± 7.75983e-03
  CSA_P1  : 9.68695e-03 ± 5.84647e-04
  CSA_P2  : -4.51716e-05 ± 8.90349e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [6, 7, 15, 31, 42, 45, 46, 47, 49, 70, 74, 85, 87, 91, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [31, 38, 40, 56, 57, 80, 94, 97, 98, 99, 100, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0755', '1.800', '0.1321', '1.799', '0.0825', '7.001', '0.7079', 1, 1, 1, 1, 1724165244.988487]
VI_after__Init : ['1.202', '0.0755', '1.800', '0.1320', '1.800', '0.0769', '7.000', '0.7078', 1, 1, 1, 1, 1724165253.137943]
VI_at__the_End : ['1.201', '0.4841', '1.800', '0.1350', '1.804', '0.1114', '7.000', '0.7086', 1, 1, 1, 1, 1724165310.1295402]