TEST_NAME : Wafer
TEST_DATE : 24_08_20-17_22_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-015-006-07 | FUSED_ID : 6359364768382382183
  IC_TEMP :  -91.30 | VDDM : 1112.11 | AUX_INT :  -10.55 | CsaBias :   43.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.75570e-03 / 2
  ADC_P0  : -1.05488e-02 ± 2.84284e-02
  ADC_P1  : 9.02655e-03 ± 7.47279e-04
  ADC_P2  : -6.45897e-06 ± 3.92985e-06
  CSA_Chi2/NDF : 1.40130e-04 / 2
  CSA_P0  : 5.85990e-02 ± 7.89566e-03
  CSA_P1  : 1.03456e-02 ± 5.94881e-04
  CSA_P2  : -7.51816e-05 ± 9.05933e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [5, 15, 19, 53, 68, 70, 75, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [1, 20, 41, 46, 63, 69, 74, 85, 98, 106, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3505', '1.800', '0.1305', '1.799', '0.1006', '7.000', '0.7079', 1, 1, 1, 1, 1724167375.6371574]
VI_after__Init : ['1.201', '0.3540', '1.800', '0.1311', '1.800', '0.0944', '7.000', '0.7077', 1, 1, 1, 1, 1724167384.2655644]
VI_at__the_End : ['1.201', '0.4102', '1.800', '0.1346', '1.799', '0.1166', '7.000', '0.7085', 1, 1, 1, 1, 1724167441.9000719]