TEST_NAME : Wafer
TEST_DATE : 24_08_20-17_21_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-015-007-07 | FUSED_ID : 6359364768382382199
  IC_TEMP :  -90.94 | VDDM : 1111.16 | AUX_INT :  -13.43 | CsaBias :   49.72
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.71162e-03 / 2
  ADC_P0  : -1.34307e-02 ± 3.53669e-02
  ADC_P1  : 9.06779e-03 ± 9.17078e-04
  ADC_P2  : -6.65660e-06 ± 4.79902e-06
  CSA_Chi2/NDF : 1.22894e-04 / 2
  CSA_P0  : 5.96977e-02 ± 7.39413e-03
  CSA_P1  : 1.01676e-02 ± 5.57094e-04
  CSA_P2  : -7.19769e-05 ± 8.48388e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [2, 4, 6, 10, 17, 21, 51, 56, 57, 80, 91, 106, 113, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [29, 31, 34, 42, 48, 63, 114, 119, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1310', '1.800', '0.1189', '1.799', '0.0820', '7.000', '0.7078', 1, 1, 1, 1, 1724167269.4593213]
VI_after__Init : ['1.202', '0.1311', '1.800', '0.1189', '1.799', '0.0754', '7.000', '0.7079', 1, 1, 1, 1, 1724167277.4727397]
VI_at__the_End : ['1.201', '0.4111', '1.800', '0.1335', '1.803', '0.1192', '7.000', '0.7086', 1, 1, 1, 1, 1724167334.1973715]