TEST_NAME : Wafer
TEST_DATE : 24_08_20-17_17_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-015-009-07 | FUSED_ID : 6359364768382382231
  IC_TEMP :  -83.87 | VDDM : 1110.98 | AUX_INT :  -12.91 | CsaBias :   46.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.48521e-03 / 2
  ADC_P0  : -1.29085e-02 ± 3.38337e-02
  ADC_P1  : 8.54642e-03 ± 8.25305e-04
  ADC_P2  : -6.12881e-06 ± 4.05114e-06
  CSA_Chi2/NDF : 1.55512e-04 / 2
  CSA_P0  : 5.80884e-02 ± 8.31773e-03
  CSA_P1  : 1.04795e-02 ± 6.26681e-04
  CSA_P2  : -7.14397e-05 ± 9.54361e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [0, 5, 10, 21, 23, 33, 34, 57, 65, 66, 74, 78, 85, 86, 110, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [10, 27, 28, 32, 51, 80, 86, 88, 103, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2888', '1.800', '0.1633', '1.799', '0.1004', '7.000', '0.7086', 1, 1, 1, 1, 1724167055.0057588]
VI_after__Init : ['1.201', '0.2883', '1.800', '0.1642', '1.799', '0.0929', '7.000', '0.7079', 1, 1, 1, 1, 1724167062.9761696]
VI_at__the_End : ['1.201', '0.4309', '1.800', '0.1321', '1.802', '0.1206', '7.000', '0.7088', 1, 1, 1, 1, 1724167119.0268662]