TEST_NAME : Wafer
TEST_DATE : 24_08_20-16_52_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-015-023-00 | FUSED_ID : 6359364768382382448
  IC_TEMP :  -62.40 | VDDM : 1119.46 | AUX_INT :  -10.22 | CsaBias :   64.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.61897e-03 / 2
  ADC_P0  : -1.02215e-02 ± 2.72708e-02
  ADC_P1  : 8.35444e-03 ± 6.60089e-04
  ADC_P2  : -5.78200e-06 ± 3.18990e-06
  CSA_Chi2/NDF : 1.71043e-04 / 2
  CSA_P0  : 5.72417e-02 ± 8.72319e-03
  CSA_P1  : 1.01017e-02 ± 6.57229e-04
  CSA_P2  : -5.45838e-05 ± 1.00088e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [11, 15, 20, 29, 38, 44, 71, 76, 80, 81, 82, 87, 91, 105, 109, 111, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [5, 6, 15, 16, 39, 51, 68, 77, 85, 88, 96, 109, 121, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2752', '1.800', '0.1378', '1.799', '0.0858', '7.000', '0.7078', 1, 1, 1, 1, 1724165564.5089993]
VI_after__Init : ['1.201', '0.2753', '1.800', '0.1377', '1.800', '0.0803', '7.000', '0.7076', 1, 1, 1, 1, 1724165572.5893936]
VI_at__the_End : ['1.201', '0.4713', '1.800', '0.1338', '1.803', '0.1144', '7.000', '0.7085', 1, 1, 1, 1, 1724165627.4882197]