TEST_NAME : Wafer
TEST_DATE : 24_08_20-17_30_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-016-007-15 | FUSED_ID : 6359364768382386303
  IC_TEMP :  -94.00 | VDDM : 1120.16 | AUX_INT :  -10.67 | CsaBias :   43.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.92771e-03 / 2
  ADC_P0  : -1.06658e-02 ± 2.98357e-02
  ADC_P1  : 9.04450e-03 ± 7.91821e-04
  ADC_P2  : -6.16048e-06 ± 4.20667e-06
  CSA_Chi2/NDF : 1.69668e-04 / 2
  CSA_P0  : 6.00623e-02 ± 8.68806e-03
  CSA_P1  : 1.02744e-02 ± 6.54583e-04
  CSA_P2  : -7.28504e-05 ± 9.96852e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [3, 21, 38, 53, 69, 76, 94, 95, 96, 100, 101, 106, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [8, 10, 22, 27, 41, 50, 51, 52, 59, 76, 85, 96, 104, 105, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2862', '1.800', '0.1717', '1.799', '0.0996', '7.000', '0.7070', 1, 1, 1, 1, 1724167803.628717]
VI_after__Init : ['1.201', '0.2879', '1.800', '0.1721', '1.800', '0.0948', '7.000', '0.7072', 1, 1, 1, 1, 1724167810.9861994]
VI_at__the_End : ['1.201', '0.4162', '1.800', '0.1335', '1.784', '0.1201', '7.000', '0.7079', 1, 1, 1, 1, 1724167867.9055326]