TEST_NAME : Wafer
TEST_DATE : 24_08_20-17_31_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-016-008-15 | FUSED_ID : 6359364768382386319
  IC_TEMP :  -96.56 | VDDM : 1102.95 | AUX_INT :  -36.16 | CsaBias :   20.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.10161e-03 / 2
  ADC_P0  : -3.61551e-02 ± 5.07287e-02
  ADC_P1  : 9.46516e-03 ± 1.33269e-03
  ADC_P2  : -6.77020e-06 ± 7.13133e-06
  CSA_Chi2/NDF : 9.83673e-05 / 2
  CSA_P0  : 5.76107e-02 ± 6.61527e-03
  CSA_P1  : 1.01906e-02 ± 4.98413e-04
  CSA_P2  : -7.75531e-05 ± 7.59024e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [24, 28, 39, 53, 64, 76, 83, 84, 93, 99, 106, 108, 114, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [10, 24, 40, 51, 62, 64, 69, 76, 89, 101, 108, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1898', '1.799', '0.1547', '1.799', '0.0929', '7.000', '0.7072', 1, 1, 1, 1, 1724167909.6587236]
VI_after__Init : ['1.202', '0.1900', '1.800', '0.1550', '1.800', '0.0855', '7.000', '0.7069', 1, 1, 1, 1, 1724167917.7752569]
VI_at__the_End : ['1.201', '0.3896', '1.800', '0.1306', '1.803', '0.1125', '7.000', '0.7080', 1, 1, 1, 1, 1724167973.13055]