TEST_NAME : Wafer
TEST_DATE : 24_08_20-17_44_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-016-015-15 | FUSED_ID : 6359364768382386431
  IC_TEMP :  -65.46 | VDDM : 1115.12 | AUX_INT :   -9.95 | CsaBias :   66.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.62233e-03 / 2
  ADC_P0  : -9.95162e-03 ± 2.73003e-02
  ADC_P1  : 8.51668e-03 ± 6.72357e-04
  ADC_P2  : -6.18127e-06 ± 3.29702e-06
  CSA_Chi2/NDF : 2.03588e-04 / 2
  CSA_P0  : 5.67372e-02 ± 9.51695e-03
  CSA_P1  : 1.01000e-02 ± 7.17034e-04
  CSA_P2  : -5.73783e-05 ± 1.09196e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [4, 10, 14, 20, 34, 39, 41, 47, 54, 81, 84, 90, 95, 120, 121, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [8, 12, 17, 27, 46, 49, 67, 77, 101, 104, 111, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3069', '1.800', '0.1364', '1.799', '0.0958', '7.000', '0.7076', 1, 1, 1, 1, 1724168656.644279]
VI_after__Init : ['1.201', '0.3074', '1.800', '0.1366', '1.800', '0.0904', '7.000', '0.7076', 1, 1, 1, 1, 1724168663.9377291]
VI_at__the_End : ['1.202', '0.4583', '1.800', '0.1330', '1.800', '0.1166', '7.000', '0.7082', 1, 1, 1, 1, 1724168719.9326403]