TEST_NAME : Wafer
TEST_DATE : 24_08_20-17_51_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-016-019-08 | FUSED_ID : 6359364768382386488
  IC_TEMP :  -67.14 | VDDM : 1107.46 | AUX_INT :  -11.34 | CsaBias :   63.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.12264e-03 / 2
  ADC_P0  : -1.13448e-02 ± 3.12832e-02
  ADC_P1  : 8.31349e-03 ± 7.51096e-04
  ADC_P2  : -5.69868e-06 ± 3.60750e-06
  CSA_Chi2/NDF : 1.72787e-04 / 2
  CSA_P0  : 5.74863e-02 ± 8.76755e-03
  CSA_P1  : 9.86611e-03 ± 6.60572e-04
  CSA_P2  : -5.55333e-05 ± 1.00597e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [18, 20, 21, 24, 34, 56, 63, 70, 72, 81, 84, 91, 92, 100, 107, 110, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [1, 5, 39, 48, 54, 63, 73, 80, 87, 88, 104, 113, 117, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2967', '1.800', '0.1471', '1.799', '0.0895', '7.000', '0.7075', 1, 1, 1, 1, 1724169082.2339704]
VI_after__Init : ['1.201', '0.2975', '1.800', '0.1476', '1.800', '0.0835', '7.000', '0.7077', 1, 1, 1, 1, 1724169090.1773937]
VI_at__the_End : ['1.201', '0.4540', '1.800', '0.1335', '1.802', '0.1144', '7.000', '0.7084', 1, 1, 1, 1, 1724169145.7143555]