TEST_NAME : Wafer
TEST_DATE : 24_08_20-17_58_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-016-023-08 | FUSED_ID : 6359364768382386552
  IC_TEMP :  -58.23 | VDDM : 1120.02 | AUX_INT :   -7.48 | CsaBias :   73.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08961e-03 / 2
  ADC_P0  : -7.47624e-03 ± 2.23987e-02
  ADC_P1  : 8.14136e-03 ± 5.47360e-04
  ADC_P2  : -4.76078e-06 ± 2.65516e-06
  CSA_Chi2/NDF : 1.48676e-04 / 2
  CSA_P0  : 5.84693e-02 ± 8.13285e-03
  CSA_P1  : 9.79578e-03 ± 6.12752e-04
  CSA_P2  : -4.84544e-05 ± 9.33148e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [18, 23, 37, 39, 55, 57, 58, 64, 91, 92, 104, 106, 108, 116, 126, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [5, 10, 19, 29, 39, 49, 53, 61, 69, 83, 90, 104, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3369', '1.800', '0.1214', '1.799', '0.0961', '7.000', '0.7079', 1, 1, 1, 1, 1724169509.0892987]
VI_after__Init : ['1.201', '0.3370', '1.800', '0.1214', '1.799', '0.0903', '7.000', '0.7078', 1, 1, 1, 1, 1724169517.0737226]
VI_at__the_End : ['1.201', '0.4780', '1.800', '0.1364', '1.799', '0.1113', '7.000', '0.7089', 1, 1, 1, 1, 1724169572.263629]