TEST_NAME : Wafer
TEST_DATE : 24_08_20-18_25_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-017-008-02 | FUSED_ID : 6359364768382390402
  IC_TEMP :  -80.04 | VDDM : 1106.81 | AUX_INT :  -12.28 | CsaBias :   69.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.27987e-03 / 2
  ADC_P0  : -1.22798e-02 ± 3.24062e-02
  ADC_P1  : 9.16313e-03 ± 8.52908e-04
  ADC_P2  : -6.87160e-06 ± 4.51186e-06
  CSA_Chi2/NDF : 1.72348e-04 / 2
  CSA_P0  : 5.86313e-02 ± 8.75640e-03
  CSA_P1  : 1.03932e-02 ± 6.59732e-04
  CSA_P2  : -6.83801e-05 ± 1.00469e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [2, 6, 16, 22, 27, 34, 45, 57, 72, 83, 110, 114, 117, 119, 123, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [2, 20, 38, 59, 77, 83, 105, 120, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2456', '1.800', '0.1552', '1.799', '0.0985', '7.000', '0.7076', 1, 1, 1, 1, 1724171108.5639205]
VI_after__Init : ['1.201', '0.2470', '1.800', '0.1554', '1.800', '0.0923', '7.000', '0.7076', 1, 1, 1, 1, 1724171117.3322697]
VI_at__the_End : ['1.201', '0.4375', '1.800', '0.1378', '1.804', '0.1178', '7.000', '0.7088', 1, 1, 1, 1, 1724171171.1560879]