TEST_NAME : Wafer
TEST_DATE : 24_08_20-18_23_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-017-009-02 | FUSED_ID : 6359364768382390418
  IC_TEMP :  -78.68 | VDDM : 1110.56 | AUX_INT :  -11.75 | CsaBias :   57.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.25057e-03 / 2
  ADC_P0  : -1.17457e-02 ± 3.22129e-02
  ADC_P1  : 8.66050e-03 ± 8.01513e-04
  ADC_P2  : -6.34787e-06 ± 3.99007e-06
  CSA_Chi2/NDF : 1.76460e-04 / 2
  CSA_P0  : 5.75567e-02 ± 8.86025e-03
  CSA_P1  : 9.84272e-03 ± 6.67556e-04
  CSA_P2  : -5.99597e-05 ± 1.01661e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [10, 12, 17, 28, 37, 40, 107, 116, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [6, 9, 14, 16, 22, 30, 39, 43, 47, 57, 61, 79, 101, 105, 114, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1310', '1.800', '0.1655', '1.799', '0.0851', '7.000', '0.7080', 1, 1, 1, 1, 1724171002.310181]
VI_after__Init : ['1.201', '0.1310', '1.800', '0.1656', '1.800', '0.0796', '7.000', '0.7078', 1, 1, 1, 1, 1724171010.4156191]
VI_at__the_End : ['1.201', '0.4342', '1.800', '0.1309', '1.803', '0.1199', '7.000', '0.7083', 1, 1, 1, 1, 1724171064.7603416]