TEST_NAME : Wafer
TEST_DATE : 24_08_20-18_16_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-017-013-02 | FUSED_ID : 6359364768382390482
  IC_TEMP :  -88.77 | VDDM : 1103.23 | AUX_INT :  -12.81 | CsaBias :   48.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.34459e-03 / 2
  ADC_P0  : -1.28136e-02 ± 3.28021e-02
  ADC_P1  : 8.87731e-03 ± 8.19391e-04
  ADC_P2  : -7.16774e-06 ± 4.10752e-06
  CSA_Chi2/NDF : 1.50880e-04 / 2
  CSA_P0  : 5.96737e-02 ± 8.19292e-03
  CSA_P1  : 1.06141e-02 ± 6.17278e-04
  CSA_P2  : -7.41302e-05 ± 9.40041e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [5, 13, 20, 46, 49, 59, 64, 65, 68, 102, 104, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [1, 2, 7, 29, 35, 39, 44, 48, 51, 71, 75, 85, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2572', '1.800', '0.1706', '1.799', '0.0899', '7.000', '0.7079', 1, 1, 1, 1, 1724170575.3807003]
VI_after__Init : ['1.201', '0.2577', '1.800', '0.1711', '1.802', '0.0841', '7.000', '0.7077', 1, 1, 1, 1, 1724170583.4660945]
VI_at__the_End : ['1.201', '0.4310', '1.800', '0.1342', '1.803', '0.1188', '7.000', '0.7088', 1, 1, 1, 1, 1724170638.8586988]