TEST_NAME : Wafer
TEST_DATE : 24_08_20-18_12_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-017-015-02 | FUSED_ID : 6359364768382390514
  IC_TEMP :  -86.51 | VDDM : 1110.37 | AUX_INT :  -10.94 | CsaBias :   50.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.92493e-03 / 2
  ADC_P0  : -1.09364e-02 ± 2.98114e-02
  ADC_P1  : 8.86012e-03 ± 7.76597e-04
  ADC_P2  : -5.70598e-06 ± 4.06111e-06
  CSA_Chi2/NDF : 1.47480e-04 / 2
  CSA_P0  : 6.03517e-02 ± 8.10008e-03
  CSA_P1  : 1.05239e-02 ± 6.10283e-04
  CSA_P2  : -7.27744e-05 ± 9.29388e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [6, 28, 66, 84, 110, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [9, 30, 65, 72, 78, 86, 93, 95, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3902', '1.800', '0.1217', '1.799', '0.0999', '6.999', '0.7078', 1, 1, 1, 1, 1724170362.7647173]
VI_after__Init : ['1.202', '0.3914', '1.800', '0.1234', '1.799', '0.0935', '7.000', '0.7077', 1, 1, 1, 1, 1724170370.7740943]
VI_at__the_End : ['1.201', '0.4304', '1.800', '0.1364', '1.804', '0.1188', '7.000', '0.7086', 1, 1, 1, 1, 1724170425.3886907]