TEST_NAME : Wafer
TEST_DATE : 24_08_20-18_05_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-017-019-05 | FUSED_ID : 6359364768382390581
  IC_TEMP :  -81.96 | VDDM : 1096.77 | AUX_INT :  -12.93 | CsaBias :   53.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.20939e-03 / 2
  ADC_P0  : -1.29337e-02 ± 3.86643e-02
  ADC_P1  : 8.28714e-03 ± 9.43159e-04
  ADC_P2  : -4.70149e-06 ± 4.63911e-06
  CSA_Chi2/NDF : 1.57194e-04 / 2
  CSA_P0  : 5.68753e-02 ± 8.36257e-03
  CSA_P1  : 9.77323e-03 ± 6.30059e-04
  CSA_P2  : -6.48907e-05 ± 9.59506e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [4, 21, 23, 37, 45, 62, 63, 72, 86, 92, 106, 117, 119, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [3, 8, 9, 13, 43, 48, 55, 61, 73, 93, 99, 115, 117, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1729', '1.800', '0.1641', '1.799', '0.0909', '7.000', '0.7090', 1, 1, 1, 1, 1724169936.5100057]
VI_after__Init : ['1.201', '0.1722', '1.800', '0.1644', '1.800', '0.0828', '7.000', '0.7077', 1, 1, 1, 1, 1724169944.464327]
VI_at__the_End : ['1.201', '0.4108', '1.800', '0.1306', '1.802', '0.1195', '7.000', '0.7086', 1, 1, 1, 1, 1724169999.7676637]