TEST_NAME : Wafer
TEST_DATE : 24_08_20-18_30_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-018-010-12 | FUSED_ID : 6359364768382394540
  IC_TEMP :  -83.83 | VDDM : 1111.25 | AUX_INT :  -10.17 | CsaBias :   51.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.64040e-03 / 2
  ADC_P0  : -1.01663e-02 ± 2.74989e-02
  ADC_P1  : 8.78606e-03 ± 7.13778e-04
  ADC_P2  : -5.54246e-06 ± 3.71410e-06
  CSA_Chi2/NDF : 1.61056e-04 / 2
  CSA_P0  : 5.74601e-02 ± 8.46468e-03
  CSA_P1  : 1.03913e-02 ± 6.37753e-04
  CSA_P2  : -7.01340e-05 ± 9.71222e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [9, 13, 14, 25, 47, 51, 57, 64, 66, 73, 88, 104, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [14, 15, 31, 43, 48, 50, 62, 67, 76, 80, 81, 100, 107, 111, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2882', '1.800', '0.1401', '1.799', '0.0962', '7.000', '0.7079', 1, 1, 1, 1, 1724171428.061294]
VI_after__Init : ['1.201', '0.2887', '1.800', '0.1404', '1.800', '0.0905', '7.000', '0.7076', 1, 1, 1, 1, 1724171435.3586311]
VI_at__the_End : ['1.201', '0.4291', '1.800', '0.1332', '1.778', '0.1198', '7.000', '0.7085', 1, 1, 1, 1, 1724171491.5283551]