TEST_NAME : Wafer
TEST_DATE : 24_08_20-18_39_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-018-015-12 | FUSED_ID : 6359364768382394620
  IC_TEMP :  -78.13 | VDDM : 1114.58 | AUX_INT :  -12.81 | CsaBias :   63.85
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.61378e-03 / 2
  ADC_P0  : -1.28090e-02 ± 3.47378e-02
  ADC_P1  : 8.57324e-03 ± 8.52280e-04
  ADC_P2  : -6.14936e-06 ± 4.19988e-06
  CSA_Chi2/NDF : 1.74732e-04 / 2
  CSA_P0  : 5.98388e-02 ± 8.81676e-03
  CSA_P1  : 1.04758e-02 ± 6.64279e-04
  CSA_P2  : -6.69719e-05 ± 1.01162e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  19
 | N_BROKEN_FAST :  [8, 12, 31, 47, 50, 62, 67, 70, 78, 81, 82, 87, 90, 98, 104, 112, 113, 117, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [6, 8, 17, 37, 51, 59, 76, 98, 115, 117, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1883', '1.800', '0.1356', '1.799', '0.0851', '7.000', '0.7080', 1, 1, 1, 1, 1724171961.3702905]
VI_after__Init : ['1.201', '0.1884', '1.800', '0.1356', '1.800', '0.0792', '7.000', '0.7079', 1, 1, 1, 1, 1724171969.3986557]
VI_at__the_End : ['1.201', '0.4487', '1.800', '0.1334', '1.804', '0.1199', '7.000', '0.7085', 1, 1, 1, 1, 1724172026.994289]