TEST_NAME : Wafer
TEST_DATE : 24_08_20-18_44_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-018-018-11 | FUSED_ID : 6359364768382394667
  IC_TEMP :  -75.18 | VDDM : 1116.11 | AUX_INT :  -10.18 | CsaBias :   66.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.84573e-03 / 2
  ADC_P0  : -1.01835e-02 ± 2.91632e-02
  ADC_P1  : 8.54754e-03 ± 7.24695e-04
  ADC_P2  : -6.02497e-06 ± 3.58744e-06
  CSA_Chi2/NDF : 1.91814e-04 / 2
  CSA_P0  : 5.63250e-02 ± 9.23768e-03
  CSA_P1  : 9.53840e-03 ± 6.95992e-04
  CSA_P2  : -5.24997e-05 ± 1.05991e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [1, 5, 24, 28, 37, 46, 50, 53, 55, 102, 117, 121, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [2, 11, 25, 40, 55, 66, 72, 77, 85, 107, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1776', '1.800', '0.1318', '1.799', '0.0874', '7.000', '0.7079', 1, 1, 1, 1, 1724172281.5508153]
VI_after__Init : ['1.202', '0.1776', '1.800', '0.1318', '1.800', '0.0821', '7.000', '0.7078', 1, 1, 1, 1, 1724172289.525171]
VI_at__the_End : ['1.201', '0.4429', '1.800', '0.1299', '1.803', '0.1183', '7.000', '0.7086', 1, 1, 1, 1, 1724172344.7529452]