TEST_NAME : Wafer
TEST_DATE : 24_08_21-11_14_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-018-020-11 | FUSED_ID : 6359364768382394699
  IC_TEMP :  -95.80 | VDDM : 1093.87 | AUX_INT :  -11.34 | CsaBias :   42.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.05350e-03 / 2
  ADC_P0  : -1.13436e-02 ± 3.07471e-02
  ADC_P1  : 8.95500e-03 ± 7.90968e-04
  ADC_P2  : -6.85660e-06 ± 4.06663e-06
  CSA_Chi2/NDF : 1.45242e-04 / 2
  CSA_P0  : 5.68193e-02 ± 8.03837e-03
  CSA_P1  : 9.84605e-03 ± 6.05633e-04
  CSA_P2  : -6.69956e-05 ± 9.22307e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [4, 7, 10, 13, 18, 24, 26, 27, 29, 44, 66, 107, 108, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [15, 28, 31, 33, 42, 49, 57, 61, 80, 98, 104, 107, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3245', '1.799', '0.1114', '1.800', '0.0990', '7.000', '0.7083', 1, 1, 1, 1, 1724231683.947406]
VI_after__Init : ['1.201', '0.3244', '1.799', '0.1114', '1.800', '0.0919', '7.000', '0.7073', 1, 1, 1, 1, 1724231692.0817657]
VI_at__the_End : ['1.201', '0.4071', '1.800', '0.1304', '1.804', '0.1202', '7.000', '0.7082', 1, 1, 1, 1, 1724231745.496007]