TEST_NAME : Wafer
TEST_DATE : 24_08_21-12_26_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-002-010-01 | FUSED_ID : 6359364768383377569
  IC_TEMP : -163.14 | VDDM : 1104.47 | AUX_INT :    0.00 | CsaBias :   29.93
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 4.55416e-03 / 2
  ADC_P0  : 0.00000e+00 ± 4.77187e-02
  ADC_P1  : 1.00022e-02 ± 8.81653e-04
  ADC_P2  : -8.31462e-06 ± 6.18444e-06
  CSA_Chi2/NDF : 1.65486e-04 / 2
  CSA_P0  : 6.35185e-02 ± 8.58031e-03
  CSA_P1  : 9.56809e-03 ± 6.46464e-04
  CSA_P2  : -8.81926e-05 ± 9.84488e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  44
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  [0, 1, 3, 7, 8, 11, 14, 15, 21, 22, 26, 27, 29, 32, 47, 49, 50, 51, 53, 54, 60, 63, 65, 67, 78, 89, 91, 93, 94, 95, 97, 98, 99, 101, 108, 112, 116, 117, 118, 119, 120, 121, 123, 127]
   P_BROKEN_DISC :  48
 | P_BROKEN_FAST :  [9, 10, 11, 15, 22, 25, 26, 30, 33, 34, 38, 39, 43, 47, 49, 50, 51, 53, 57, 63, 66, 70, 71, 73, 74, 77, 78, 79, 81, 82, 86, 87, 89, 90, 93, 94, 95, 99, 101, 102, 103, 107, 109, 114, 115, 117, 119, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2589', '1.800', '0.1425', '1.799', '0.0985', '7.000', '0.7079', 1, 1, 1, 1, 1724235997.4363847]
VI_after__Init : ['1.200', '0.2636', '1.800', '0.1453', '1.805', '0.0929', '7.000', '0.7079', 1, 1, 1, 1, 1724236006.158553]
VI_at__the_End : ['1.187', '0.3183', '1.800', '0.1336', '1.806', '0.1227', '7.000', '0.7086', 1, 1, 1, 1, 1724236063.412575]