TEST_NAME : Wafer
TEST_DATE : 24_08_21-12_31_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-002-013-01 | FUSED_ID : 6359364768383377617
  IC_TEMP : -132.58 | VDDM : 1076.15 | AUX_INT :    0.00 | CsaBias :   43.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.69789e-02 / 2
  ADC_P0  : 0.00000e+00 ± 9.21382e-02
  ADC_P1  : 1.08969e-02 ± 1.72040e-03
  ADC_P2  : -1.86992e-05 ± 1.21228e-05
  CSA_Chi2/NDF : 1.03808e-04 / 2
  CSA_P0  : 6.00464e-02 ± 6.79575e-03
  CSA_P1  : 9.92415e-03 ± 5.12010e-04
  CSA_P2  : -8.71802e-05 ± 7.79731e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  43
 | N_BROKEN_FAST :  [30, 47, 66, 93, 116]
 | N_BROKEN_SLOW :  [0, 3, 4, 5, 8, 10, 11, 16, 17, 19, 21, 29, 35, 39, 44, 45, 47, 51, 58, 60, 61, 65, 68, 75, 80, 83, 88, 89, 90, 91, 94, 96, 97, 115, 116, 120, 124, 127]
   P_BROKEN_DISC :  40
 | P_BROKEN_FAST :  [1, 5, 7, 9, 13, 22, 29, 32, 36, 40, 43, 47, 48, 50, 53, 57, 59, 62, 68, 69, 70, 71, 73, 74, 78, 81, 82, 91, 92, 93, 94, 95, 98, 99, 100, 101, 102, 110, 116, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2883', '1.800', '0.1303', '1.800', '0.0960', '7.000', '0.7079', 1, 1, 1, 1, 1724236283.131243]
VI_after__Init : ['1.201', '0.2953', '1.800', '0.1313', '1.799', '0.0901', '7.000', '0.7079', 1, 1, 1, 1, 1724236291.3047562]
VI_at__the_End : ['1.183', '0.3338', '1.800', '0.1250', '1.799', '0.1319', '7.000', '0.7087', 1, 1, 1, 1, 1724236349.1982868]