TEST_NAME : Wafer
TEST_DATE : 24_08_21-12_37_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-002-017-06 | FUSED_ID : 6359364768383377686
  IC_TEMP : -118.74 | VDDM : 1095.31 | AUX_INT :    0.00 | CsaBias :   52.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.45907e-03 / 2
  ADC_P0  : 0.00000e+00 ± 6.50349e-02
  ADC_P1  : 1.04774e-02 ± 1.21267e-03
  ADC_P2  : -1.41623e-05 ± 8.48087e-06
  CSA_Chi2/NDF : 7.41365e-05 / 2
  CSA_P0  : 6.14369e-02 ± 5.74300e-03
  CSA_P1  : 1.02745e-02 ± 4.32693e-04
  CSA_P2  : -8.25546e-05 ± 6.58941e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [0, 7, 36, 40, 42, 52, 55, 77, 84, 87, 94, 96, 107, 112, 116, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [16, 18, 26, 36, 50, 52, 58, 63, 74, 77, 101, 102, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2175', '1.800', '0.1580', '1.799', '0.1034', '7.000', '0.7077', 1, 1, 1, 1, 1724236659.47118]
VI_after__Init : ['1.202', '0.2183', '1.800', '0.1592', '1.800', '0.0972', '7.000', '0.7075', 1, 1, 1, 1, 1724236667.7226152]
VI_at__the_End : ['1.195', '0.3753', '1.800', '0.1307', '1.799', '0.1314', '7.000', '0.7084', 1, 1, 1, 1, 1724236727.45609]