TEST_NAME : Wafer
TEST_DATE : 24_08_21-12_59_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-003-011-12 | FUSED_ID : 6359364768383381692
  IC_TEMP :  -96.12 | VDDM : 1121.55 | AUX_INT :    0.00 | CsaBias :   35.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.83711e-03 / 2
  ADC_P0  : 0.00000e+00 ± 3.03076e-02
  ADC_P1  : 9.01679e-03 ± 5.23972e-04
  ADC_P2  : -6.44663e-06 ± 3.34607e-06
  CSA_Chi2/NDF : 9.77476e-05 / 2
  CSA_P0  : 5.81511e-02 ± 6.59440e-03
  CSA_P1  : 1.07446e-02 ± 4.96840e-04
  CSA_P2  : -7.91279e-05 ± 7.56629e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  20
 | N_BROKEN_FAST :  [4, 10, 21, 25, 29, 30, 31, 33, 34, 40, 42, 63, 69, 70, 76, 78, 100, 107, 119]
 | N_BROKEN_SLOW :  [117]
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [14, 20, 22, 36, 39, 40, 52, 58, 68, 90, 91, 99, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1384', '1.800', '0.1610', '1.800', '0.0937', '7.000', '0.7078', 1, 1, 1, 1, 1724237996.4004006]
VI_after__Init : ['1.202', '0.1385', '1.800', '0.1611', '1.800', '0.0876', '7.000', '0.7077', 1, 1, 1, 1, 1724238004.827708]
VI_at__the_End : ['1.199', '0.4169', '1.800', '0.1313', '1.800', '0.1279', '7.000', '0.7086', 1, 1, 1, 1, 1724238068.4165792]