TEST_NAME : Wafer
TEST_DATE : 24_08_21-12_58_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-003-012-12 | FUSED_ID : 6359364768383381708
  IC_TEMP :  -94.88 | VDDM : 1121.24 | AUX_INT :    0.00 | CsaBias :   35.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.94222e-02 / 2
  ADC_P0  : 0.00000e+00 ± 2.22960e-01
  ADC_P1  : 8.97536e-03 ± 3.80642e-03
  ADC_P2  : -6.90369e-06 ± 2.38694e-05
  CSA_Chi2/NDF : 1.46307e-04 / 2
  CSA_P0  : 5.68734e-02 ± 8.06779e-03
  CSA_P1  : 1.02341e-02 ± 6.07850e-04
  CSA_P2  : -7.22348e-05 ± 9.25683e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [1, 5, 25, 49, 65, 71, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [5, 15, 17, 32, 44, 80, 82, 98, 115, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1859', '1.800', '0.1498', '1.800', '0.0943', '7.000', '0.7079', 1, 1, 1, 1, 1724237902.0349205]
VI_after__Init : ['1.201', '0.1859', '1.800', '0.1499', '1.801', '0.0884', '7.000', '0.7077', 1, 1, 1, 1, 1724237910.483249]
VI_at__the_End : ['1.202', '0.4087', '1.800', '0.1300', '1.807', '0.1287', '7.000', '0.7086', 1, 1, 1, 1, 1724237973.9492376]