TEST_NAME : Wafer
TEST_DATE : 24_08_21-12_53_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-003-015-12 | FUSED_ID : 6359364768383381756
  IC_TEMP :  -82.14 | VDDM : 1119.69 | AUX_INT :    0.00 | CsaBias :   53.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.90730e-03 / 2
  ADC_P0  : 0.00000e+00 ± 3.08812e-02
  ADC_P1  : 8.91733e-03 ± 5.13233e-04
  ADC_P2  : -7.26899e-06 ± 3.15463e-06
  CSA_Chi2/NDF : 1.42430e-04 / 2
  CSA_P0  : 5.69912e-02 ± 7.96017e-03
  CSA_P1  : 1.01559e-02 ± 5.99742e-04
  CSA_P2  : -6.51591e-05 ± 9.13336e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [2, 4, 8, 17, 25, 42, 47, 60, 68, 69, 83, 84, 94, 104, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [11, 22, 24, 30, 46, 49, 59, 67, 69, 74, 86, 91, 105, 106, 120, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2601', '1.800', '0.1641', '1.800', '0.0993', '7.000', '0.7084', 1, 1, 1, 1, 1724237614.0749683]
VI_after__Init : ['1.202', '0.2614', '1.800', '0.1647', '1.801', '0.0919', '7.000', '0.7076', 1, 1, 1, 1, 1724237622.272344]
VI_at__the_End : ['1.200', '0.4318', '1.800', '0.1311', '1.800', '0.1240', '7.000', '0.7084', 1, 1, 1, 1, 1724237689.7689633]