TEST_NAME : Wafer
TEST_DATE : 24_08_21-12_50_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-003-017-11 | FUSED_ID : 6359364768383381787
  IC_TEMP :  -99.40 | VDDM : 1104.19 | AUX_INT :    0.00 | CsaBias :   54.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.16526e-03 / 2
  ADC_P0  : 0.00000e+00 ± 3.97823e-02
  ADC_P1  : 9.05658e-03 ± 6.72161e-04
  ADC_P2  : -6.89370e-06 ± 4.26296e-06
  CSA_Chi2/NDF : 1.26772e-04 / 2
  CSA_P0  : 5.96160e-02 ± 7.50989e-03
  CSA_P1  : 1.06939e-02 ± 5.65816e-04
  CSA_P2  : -8.13464e-05 ± 8.61671e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [21, 22, 26, 33, 58, 64, 65, 79, 90, 101, 103, 108, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  19
 | P_BROKEN_FAST :  [1, 7, 11, 15, 16, 19, 42, 44, 50, 56, 57, 58, 64, 76, 82, 95, 101, 123, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3788', '1.800', '0.1554', '1.800', '0.1010', '7.000', '0.7078', 1, 1, 1, 1, 1724237424.2346575]
VI_after__Init : ['1.196', '0.3807', '1.800', '0.1574', '1.802', '0.0946', '7.000', '0.7076', 1, 1, 1, 1, 1724237431.797267]
VI_at__the_End : ['1.199', '0.4054', '1.800', '0.1376', '1.799', '0.1212', '7.000', '0.7084', 1, 1, 1, 1, 1724237497.8470223]