TEST_NAME : Wafer
TEST_DATE : 24_08_21-12_47_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-003-019-11 | FUSED_ID : 6359364768383381819
  IC_TEMP : -112.72 | VDDM : 1112.46 | AUX_INT :    0.00 | CsaBias :   48.83
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.36926e-03 / 2
  ADC_P0  : 0.00000e+00 ± 3.44185e-02
  ADC_P1  : 9.81490e-03 ± 6.11556e-04
  ADC_P2  : -9.67318e-06 ± 4.04589e-06
  CSA_Chi2/NDF : 6.73763e-05 / 2
  CSA_P0  : 6.23278e-02 ± 5.47490e-03
  CSA_P1  : 1.07581e-02 ± 4.12494e-04
  CSA_P2  : -8.24153e-05 ± 6.28179e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [10, 11, 23, 29, 43, 48, 55, 60, 61, 85, 86, 115, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [3, 4, 15, 20, 25, 33, 39, 40, 51, 58, 60, 72, 81, 86, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2835', '1.800', '0.1682', '1.799', '0.0933', '7.000', '0.7072', 1, 1, 1, 1, 1724237233.01124]
VI_after__Init : ['1.201', '0.2867', '1.800', '0.1692', '1.799', '0.0876', '7.000', '0.7073', 1, 1, 1, 1, 1724237241.2146313]
VI_at__the_End : ['1.192', '0.4051', '1.800', '0.1340', '1.800', '0.1293', '7.000', '0.7082', 1, 1, 1, 1, 1724237306.8987422]