TEST_NAME : Wafer
TEST_DATE : 24_08_21-13_09_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-004-007-04 | FUSED_ID : 6359364768383385716
  IC_TEMP :  -75.53 | VDDM : 1110.05 | AUX_INT :    0.00 | CsaBias :   60.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.08822e-03 / 2
  ADC_P0  : 0.00000e+00 ± 5.04392e-02
  ADC_P1  : 8.72251e-03 ± 8.44089e-04
  ADC_P2  : -5.29859e-06 ± 5.31291e-06
  CSA_Chi2/NDF : 1.39353e-04 / 2
  CSA_P0  : 5.89631e-02 ± 7.87374e-03
  CSA_P1  : 1.01242e-02 ± 5.93229e-04
  CSA_P2  : -6.28044e-05 ± 9.03418e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [6, 24, 40, 44, 65, 66, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [0, 6, 11, 20, 21, 24, 51, 62, 63, 65, 81, 95, 97, 102, 116, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2645', '1.800', '0.1482', '1.799', '0.1031', '7.000', '0.7086', 1, 1, 1, 1, 1724238567.3170378]
VI_after__Init : ['1.201', '0.2649', '1.800', '0.1485', '1.800', '0.0950', '7.000', '0.7078', 1, 1, 1, 1, 1724238575.2764192]
VI_at__the_End : ['1.201', '0.4436', '1.800', '0.1353', '1.800', '0.1250', '7.000', '0.7086', 1, 1, 1, 1, 1724238637.824165]