TEST_NAME : Wafer
TEST_DATE : 24_08_21-13_22_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-004-015-04 | FUSED_ID : 6359364768383385844
  IC_TEMP :  -78.41 | VDDM : 1116.69 | AUX_INT :    0.00 | CsaBias :   69.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.02379e-03 / 2
  ADC_P0  : 0.00000e+00 ± 3.18103e-02
  ADC_P1  : 8.69591e-03 ± 5.31611e-04
  ADC_P2  : -5.85864e-06 ± 3.28532e-06
  CSA_Chi2/NDF : 1.88033e-04 / 2
  CSA_P0  : 5.76714e-02 ± 9.14618e-03
  CSA_P1  : 1.01896e-02 ± 6.89099e-04
  CSA_P2  : -6.39759e-05 ± 1.04942e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [17, 18, 24, 42, 46, 55, 67, 73, 101, 103, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [3, 23, 36, 61, 75, 78, 97, 100, 108, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.1500', '1.800', '0.1695', '1.799', '0.0896', '7.000', '0.7086', 1, 1, 1, 1, 1724239332.8996186]
VI_after__Init : ['1.201', '0.1501', '1.800', '0.1696', '1.800', '0.0824', '7.000', '0.7079', 1, 1, 1, 1, 1724239341.03298]
VI_at__the_End : ['1.201', '0.4428', '1.800', '0.1338', '1.800', '0.1225', '7.000', '0.7084', 1, 1, 1, 1, 1724239403.9780953]