TEST_NAME : Wafer
TEST_DATE : 24_08_21-13_23_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-004-016-03 | FUSED_ID : 6359364768383385859
  IC_TEMP :  -84.10 | VDDM : 1116.99 | AUX_INT :    0.00 | CsaBias :   54.36
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.90157e-03 / 2
  ADC_P0  : 0.00000e+00 ± 3.08348e-02
  ADC_P1  : 9.10886e-03 ± 5.14322e-04
  ADC_P2  : -8.07410e-06 ± 3.18234e-06
  CSA_Chi2/NDF : 1.68708e-04 / 2
  CSA_P0  : 5.80318e-02 ± 8.66342e-03
  CSA_P1  : 1.05834e-02 ± 6.52727e-04
  CSA_P2  : -7.08495e-05 ± 9.94025e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [8, 16, 19, 26, 31, 42, 53, 61, 78, 81, 83, 91, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [9, 29, 35, 43, 46, 56, 59, 71, 82, 87, 100, 103, 104, 107, 109, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2217', '1.800', '0.1613', '1.800', '0.0950', '7.000', '0.7077', 1, 1, 1, 1, 1724239428.2791808]
VI_after__Init : ['1.202', '0.2220', '1.800', '0.1616', '1.800', '0.0891', '7.000', '0.7076', 1, 1, 1, 1, 1724239436.343576]
VI_at__the_End : ['1.202', '0.4384', '1.800', '0.1340', '1.800', '0.1243', '7.000', '0.7084', 1, 1, 1, 1, 1724239498.0597887]