TEST_NAME : Wafer
TEST_DATE : 24_08_21-13_28_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-004-019-03 | FUSED_ID : 6359364768383385907
  IC_TEMP :  -65.60 | VDDM : 1102.38 | AUX_INT :    0.00 | CsaBias :   64.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16501e-02 / 2
  ADC_P0  : 0.00000e+00 ± 7.63220e-02
  ADC_P1  : 8.06140e-03 ± 1.22399e-03
  ADC_P2  : -2.81943e-06 ± 7.45910e-06
  CSA_Chi2/NDF : 1.95583e-04 / 2
  CSA_P0  : 5.78873e-02 ± 9.32798e-03
  CSA_P1  : 1.03966e-02 ± 7.02796e-04
  CSA_P2  : -6.38148e-05 ± 1.07028e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [2, 3, 8, 12, 15, 28, 38, 48, 81, 90, 94, 109, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [3, 4, 11, 18, 21, 27, 35, 37, 46, 51, 52, 55, 57, 62, 71, 81, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1606', '1.800', '0.1714', '1.800', '0.0870', '7.000', '0.7077', 1, 1, 1, 1, 1724239713.9777248]
VI_after__Init : ['1.202', '0.1607', '1.800', '0.1715', '1.800', '0.0812', '7.000', '0.7077', 1, 1, 1, 1, 1724239722.8110633]
VI_at__the_End : ['1.201', '0.4549', '1.800', '0.1341', '1.801', '0.1198', '7.000', '0.7084', 1, 1, 1, 1, 1724239782.4003124]