TEST_NAME : Wafer
TEST_DATE : 24_08_21-13_30_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-004-020-03 | FUSED_ID : 6359364768383385923
  IC_TEMP :  -68.10 | VDDM : 1102.59 | AUX_INT :    0.00 | CsaBias :   67.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.69331e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.90973e-02
  ADC_P1  : 8.51818e-03 ± 4.76357e-04
  ADC_P2  : -5.98152e-06 ± 2.85635e-06
  CSA_Chi2/NDF : 1.77866e-04 / 2
  CSA_P0  : 5.74521e-02 ± 8.89546e-03
  CSA_P1  : 1.00817e-02 ± 6.70209e-04
  CSA_P2  : -5.73221e-05 ± 1.02065e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [15, 32, 43, 47, 73, 75, 85, 87, 91, 95, 108, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [0, 18, 26, 28, 55, 58, 63, 89, 97, 105, 110, 118, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3956', '1.800', '0.1478', '1.800', '0.1034', '7.000', '0.7077', 1, 1, 1, 1, 1724239809.5232117]
VI_after__Init : ['1.202', '0.3965', '1.800', '0.1481', '1.800', '0.0971', '7.000', '0.7077', 1, 1, 1, 1, 1724239818.3765109]
VI_at__the_End : ['1.201', '0.4606', '1.800', '0.1347', '1.801', '0.1176', '7.000', '0.7085', 1, 1, 1, 1, 1724239880.3786352]