TEST_NAME : Wafer
TEST_DATE : 24_08_21-14_06_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-005-006-09 | FUSED_ID : 6359364768383389801
  IC_TEMP :  -75.71 | VDDM : 1105.25 | AUX_INT :    0.00 | CsaBias :   67.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.85477e-03 / 2
  ADC_P0  : 0.00000e+00 ± 3.04530e-02
  ADC_P1  : 8.45538e-03 ± 5.12285e-04
  ADC_P2  : -4.73193e-06 ± 3.15260e-06
  CSA_Chi2/NDF : 1.93594e-04 / 2
  CSA_P0  : 5.76067e-02 ± 9.28044e-03
  CSA_P1  : 1.07735e-02 ± 6.99214e-04
  CSA_P2  : -7.14310e-05 ± 1.06482e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [1, 9, 15, 22, 25, 35, 37, 39, 53, 74, 86, 97, 98, 112, 113, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [11, 18, 19, 37, 39, 76, 77, 78, 79, 85, 96, 102, 113, 114, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2621', '1.800', '0.1408', '1.799', '0.0916', '7.000', '0.7075', 1, 1, 1, 1, 1724242008.4930418]
VI_after__Init : ['1.201', '0.2625', '1.800', '0.1405', '1.801', '0.0864', '7.000', '0.7076', 1, 1, 1, 1, 1724242016.770416]
VI_at__the_End : ['1.202', '0.4489', '1.800', '0.1382', '1.808', '0.1216', '7.000', '0.7084', 1, 1, 1, 1, 1724242081.0156436]