TEST_NAME : Wafer
TEST_DATE : 24_08_21-13_55_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-005-013-09 | FUSED_ID : 6359364768383389913
  IC_TEMP :  -74.01 | VDDM : 1109.66 | AUX_INT :    0.00 | CsaBias :   60.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.64872e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.87117e-02
  ADC_P1  : 8.66570e-03 ± 4.74011e-04
  ADC_P2  : -6.33447e-06 ± 2.87819e-06
  CSA_Chi2/NDF : 1.76462e-04 / 2
  CSA_P0  : 5.84461e-02 ± 8.86030e-03
  CSA_P1  : 1.01526e-02 ± 6.67559e-04
  CSA_P2  : -6.06771e-05 ± 1.01661e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  19
 | N_BROKEN_FAST :  [4, 8, 10, 20, 22, 32, 36, 40, 44, 50, 53, 57, 61, 67, 93, 113, 121, 126, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [5, 10, 14, 30, 73, 76, 99, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3044', '1.800', '0.1378', '1.800', '0.0883', '7.000', '0.7077', 1, 1, 1, 1, 1724241338.2552776]
VI_after__Init : ['1.202', '0.3044', '1.800', '0.1379', '1.800', '0.0828', '7.000', '0.7074', 1, 1, 1, 1, 1724241346.251784]
VI_at__the_End : ['1.201', '0.4526', '1.800', '0.1386', '1.803', '0.1198', '7.000', '0.7083', 1, 1, 1, 1, 1724241411.5290058]