TEST_NAME : Wafer
TEST_DATE : 24_08_21-13_54_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-005-014-09 | FUSED_ID : 6359364768383389929
  IC_TEMP :  -65.32 | VDDM : 1119.77 | AUX_INT :    0.00 | CsaBias :   59.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.59607e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.82495e-02
  ADC_P1  : 8.50859e-03 ± 4.54454e-04
  ADC_P2  : -6.36870e-06 ± 2.68757e-06
  CSA_Chi2/NDF : 1.86057e-04 / 2
  CSA_P0  : 5.93819e-02 ± 9.09799e-03
  CSA_P1  : 1.00483e-02 ± 6.85468e-04
  CSA_P2  : -5.53806e-05 ± 1.04389e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [13, 18, 22, 26, 33, 48, 57, 65, 81, 82, 85, 92, 101, 102, 103, 104, 111, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [24, 27, 28, 51, 52, 73, 77, 79, 82, 83, 86, 115, 116, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3129', '1.800', '0.1426', '1.799', '0.0991', '7.000', '0.7085', 1, 1, 1, 1, 1724241242.0211327]
VI_after__Init : ['1.201', '0.3131', '1.800', '0.1427', '1.799', '0.0913', '7.000', '0.7076', 1, 1, 1, 1, 1724241250.7235086]
VI_at__the_End : ['1.201', '0.4678', '1.800', '0.1361', '1.803', '0.1160', '7.000', '0.7083', 1, 1, 1, 1, 1724241313.8860457]