TEST_NAME : Wafer
TEST_DATE : 24_08_21-13_50_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-005-016-14 | FUSED_ID : 6359364768383389966
  IC_TEMP :  -71.49 | VDDM : 1119.21 | AUX_INT :    0.00 | CsaBias :   69.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.74258e-03 / 2
  ADC_P0  : 0.00000e+00 ± 3.70310e-02
  ADC_P1  : 8.69443e-03 ± 6.06330e-04
  ADC_P2  : -6.40371e-06 ± 3.68830e-06
  CSA_Chi2/NDF : 1.79796e-04 / 2
  CSA_P0  : 5.83047e-02 ± 8.94361e-03
  CSA_P1  : 1.03986e-02 ± 6.73836e-04
  CSA_P2  : -6.39473e-05 ± 1.02617e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [22, 33, 40, 41, 50, 77, 88, 93, 96, 112, 120, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [14, 34, 39, 41, 46, 47, 67, 70, 77, 85, 93, 106, 122, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.1623', '1.800', '0.1671', '1.799', '0.0838', '7.000', '0.7076', 1, 1, 1, 1, 1724241051.9793975]
VI_after__Init : ['1.201', '0.1625', '1.800', '0.1672', '1.801', '0.0781', '7.000', '0.7076', 1, 1, 1, 1, 1724241060.1728055]
VI_at__the_End : ['1.201', '0.4549', '1.800', '0.1339', '1.799', '0.1181', '7.000', '0.7083', 1, 1, 1, 1, 1724241122.6475565]