TEST_NAME : Wafer
TEST_DATE : 24_08_21-14_17_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-006-007-07 | FUSED_ID : 6359364768383393911
  IC_TEMP :  -16.81 | VDDM : 1045.30 | AUX_INT :    0.00 | CsaBias :   53.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.62088e-02 / 2
  ADC_P0  : 0.00000e+00 ± 2.07616e-01
  ADC_P1  : 5.91221e-03 ± 2.98183e-03
  ADC_P2  : 9.35300e-06 ± 1.82851e-05
  CSA_Chi2/NDF : 1.75703e-04 / 2
  CSA_P0  : 5.65948e-02 ± 8.84121e-03
  CSA_P1  : 1.03085e-02 ± 6.66121e-04
  CSA_P2  : -6.04294e-05 ± 1.01442e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  19
 | N_BROKEN_FAST :  [3, 7, 21, 27, 37, 48, 54, 57, 65, 69, 72, 74, 76, 82, 90, 98, 102, 114, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [9, 28, 32, 48, 50, 55, 60, 78, 82, 89, 110, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3573', '1.800', '0.1827', '1.800', '0.0938', '7.000', '0.7075', 1, 1, 1, 1, 1724242672.218429]
VI_after__Init : ['1.201', '0.3575', '1.800', '0.1829', '1.799', '0.0881', '7.000', '0.7078', 1, 1, 1, 1, 1724242680.5308366]
VI_at__the_End : ['1.202', '0.4591', '1.800', '0.1374', '1.800', '0.1173', '7.000', '0.7083', 1, 1, 1, 1, 1724242739.7811725]