TEST_NAME : Wafer
TEST_DATE : 24_08_21-14_25_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-006-012-07 | FUSED_ID : 6359364768383393991
  IC_TEMP :  -57.15 | VDDM : 1106.45 | AUX_INT :    0.00 | CsaBias :   63.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.93523e-03 / 2
  ADC_P0  : 0.00000e+00 ± 6.68402e-02
  ADC_P1  : 7.92833e-03 ± 1.07564e-03
  ADC_P2  : -2.39675e-06 ± 6.50928e-06
  CSA_Chi2/NDF : 1.16432e-04 / 2
  CSA_P0  : 5.88640e-02 ± 7.19713e-03
  CSA_P1  : 1.05331e-02 ± 5.42252e-04
  CSA_P2  : -6.35487e-05 ± 8.25785e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [3, 8, 11, 18, 20, 23, 29, 32, 46, 47, 48, 49, 53, 70, 72, 73, 75, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [4, 6, 13, 30, 31, 49, 58, 64, 72, 74, 85, 102, 115, 123]
 | P_BROKEN_SLOW :  [101]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3729', '1.800', '0.1624', '1.800', '0.0981', '7.000', '0.7076', 1, 1, 1, 1, 1724243148.9515183]
VI_after__Init : ['1.201', '0.3733', '1.800', '0.1627', '1.801', '0.0925', '7.000', '0.7076', 1, 1, 1, 1, 1724243157.2798102]
VI_at__the_End : ['1.201', '0.4665', '1.800', '0.1352', '1.806', '0.1175', '7.000', '0.7081', 1, 1, 1, 1, 1724243223.4307444]