TEST_NAME : Wafer
TEST_DATE : 24_08_21-14_32_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-006-016-00 | FUSED_ID : 6359364768383394048
  IC_TEMP :  -63.10 | VDDM : 1121.65 | AUX_INT :    0.00 | CsaBias :   76.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25301e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.50301e-02
  ADC_P1  : 8.57263e-03 ± 4.13215e-04
  ADC_P2  : -6.09649e-06 ± 2.49100e-06
  CSA_Chi2/NDF : 1.61227e-04 / 2
  CSA_P0  : 6.05144e-02 ± 8.46918e-03
  CSA_P1  : 1.00034e-02 ± 6.38092e-04
  CSA_P2  : -5.42312e-05 ± 9.71738e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [10, 15, 31, 54, 78, 95, 103, 109, 113, 117, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [12, 16, 23, 28, 33, 38, 52, 58, 70, 96, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3215', '1.800', '0.1209', '1.799', '0.0908', '7.000', '0.7084', 1, 1, 1, 1, 1724243530.9221919]
VI_after__Init : ['1.201', '0.3218', '1.800', '0.1210', '1.800', '0.0835', '7.000', '0.7075', 1, 1, 1, 1, 1724243538.963518]
VI_at__the_End : ['1.201', '0.4715', '1.800', '0.1387', '1.804', '0.1158', '7.000', '0.7085', 1, 1, 1, 1, 1724243596.2420526]